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Materials characterization: introduction to microscopic and spectroscopic methods

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Contents

Light microscopy -- X-ray diffraction methods -- Transmission electron microscopy -- Scanning electron microscopy -- Scanning probe microscopy -- X-ray spectroscopy for elemental analysis -- Electron spectroscopy for surface analysis -- Secondary ion mass spectrometry for surface analysis -- Vibrational spectroscopy for molecular analysis -- Thermal analysis.

Publisher

  • Publication

    Weinheim: Wiley-VCH, 2013

  • Year

Is about

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Type

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Classification

  • ISBN

    • 9783527334636
    • 9783527670802
    • 3527334637
    • 3527670807

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